Patent · US Active

Methods of testing and manufacturing optical elements

US7602502B2 · kind B2 · utility

0Cited by
7References
12Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 30, 2008
Grant dateOct 13, 2009
Priority date
Expiry dateJun 30, 2028

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01B2290/20
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method of manufacturing an optical element having an optical surface of a non-rotationally symmetric shape is described. Measuring light is generated using an interferometer optics, wherein the interferometer optics has at least one diffractive component having a grating. The optical surface is positioned at a first position relative to the diffractive component, wherein first measuring light diffracted at the diffractive component is incident on the optical surface at plural locations thereof, and at least one first interference pattern generated from first measuring light reflected from the optical surface is detected. The optical surface is positioned at a second position relative to the at least one diffractive component, wherein second measuring light diffracted at the diffractive component is incident on the optical surface at plural locations thereof, and at least one second interference pattern generated from second measuring light reflected from the optical surface is detected.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.