Mirror node process verification
US7602958B1 · kind B1 · utility
3Cited by
4References
18Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Oct 18, 2004 |
| Grant date | Oct 13, 2009 |
| Priority date | — |
| Expiry date | May 31, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V10/94
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
An inspection image analysis system. At least one image processing computer is configured to receive and analyze at least one portion of an image. At least one test computer is configured to receive at least one common portion of the image also received by the at least one image processing computer, and to analyze the at least one common portion, using equivalent image processes as the corresponding at least one image processing computer. A job manager is configured to assign the common portion and to configure the corresponding image processing computer and the test computer to run equivalent image processes.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.