Method and apparatus for finding anomalies in finished parts and/or assemblies
US7602963B2 · kind B2 · utility
32Cited by
9References
17Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jan 10, 2006 |
| Grant date | Oct 13, 2009 |
| Priority date | — |
| Expiry date | Oct 24, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30164
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for non-destructive examination of parts includes producing a 3-D image of a sample of a part, extracting a point cloud of the image of the sample of the part, and registering the point cloud to a CAD coordinate system. The method further includes determining points in the point cloud of the image that are more than a specified distance from surfaces on a CAD 3-D model of the part using the same coordinate system, and utilizing the determined points to determine the presence of anomalies or present an image of anomalies in the sample of the part.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.