Patent · US Active

Apparatus and method for measuring structural parts

US7605929B2 · kind B2 · utility

4Cited by

4References

23Claims

0Family size

Assignee

BENTELER AUTOMOBILTECHNIK GMBH · DE

Inventors

Cordt Erfling · Paderborn, DE
Rainer Lübbers · Paderborn, DE
Wilfried Rostek · Paderborn, DE
Tim Finke · Bielefeld, DE

Key dates

Filing date	Mar 21, 2007
Grant date	Oct 20, 2009
Priority date	—
Expiry date	Aug 3, 2027

Classification

Technology area (CPC G)Physics
CPC primaryG01B11/245
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

This present invention relates to an apparatus for measuring structural parts which includes a measuring system having at least two sensors for optoelectronic scanning of such a structural part wherein said part and said sensors are movable relatively to each other along a shifting path and wherein said sensors are provided with a radiation source directed to a surface of the structural part and with a receiver, characterized by the fact that at least one sensor is an area sensor adapted to scan one surface section of the structural part (2) in each measuring time interval and/or that at least one sensor is a line sensor adapted to detect one profile line of said structural part in each measuring interval.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.