Landmark detection apparatus and method for intelligent system
US7606416B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 17, 2004 |
| Grant date | Oct 20, 2009 |
| Priority date | — |
| Expiry date | Feb 10, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V20/10
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A landmark detection apparatus and method, the apparatus including a first detection unit that generates N first sample blocks in a first sampling region using a first weighted sampling method according to a first degree of dispersion, and that performs a first landmark detection by comparing a feature of each first sample block a feature of a landmark model, where the first sample region is set to the entirety of a current frame image; and a second detection unit that generates N second sample blocks in a second sampling region using a second weighted sampling method according to a second degree of dispersion, and that performs a second landmark detection by comparing a feature of each second sample block the feature of the landmark model, where the second sampling region is set to an area less than the entirety of the current frame image.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.