Testing system and method for testing an electronic device
US7609081B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | May 28, 2008 |
| Grant date | Oct 27, 2009 |
| Priority date | — |
| Expiry date | May 28, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2834
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A testing system for measuring an electronic device includes a main controller for generating a control signal, a signal generator for outputting a predetermined test input signal according to the control signal, an instrument unit having a plurality of instruments, and a testing port having a plurality of probes. The plurality of probes connects corresponding testing points of the electronic device to the signal generator and the instruments. The predetermined test input signal is transmitted to the electronic device via the testing port. The instrument unit processes a test result signal outputted by the electronic device and outputs a result data. The main controller receives the result data and computes whether the result data is within a predetermined range. A related testing method is also provided.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.