Patent · US Active

Method and device for imaging test objects by means of electromagnetic waves, in particular for inspecting individuals for suspicious items

US7609196B2 · kind B2 · utility

6Cited by

5References

9Claims

0Family size

Assignee

SMITHS HEIMANN GMBH · DE

Inventors

Michael Jeck · Mainz, DE
Frank Gumbmann · Munich, DE
Lorenz-Peter Schmidt · Prüm, DE
Hue Tran · Erlangen, DE
Jochen Weinzierl · Nuremberg, DE

Key dates

Filing date	Mar 7, 2008
Grant date	Oct 27, 2009
Priority date	—
Expiry date	Mar 7, 2028

Classification

Technology area (CPC G)Physics
CPC primaryG01S13/9088
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A method for imaging test objects by means of electromagnetic waves, in particular for the purpose of checking individuals for suspicious articles, in which method the test object is illuminated by electromagnetic waves, the scattered waves are received and evaluated for an imaginal representation of the test object on the basis of the synthetic aperture principle (SAR). A synthetic aperture is produced by the waves output by an antenna being concentrated initially in spatial terms, the point of high concentration being moved on a reflector along a circle.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.