Evaluation of element distribution within a collection of images based on pixel scatterness
US7609891B2 · kind B2 · utility
Assignees
Inventor
Key dates
| Filing date | Aug 31, 2005 |
| Grant date | Oct 27, 2009 |
| Priority date | — |
| Expiry date | Mar 25, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V30/2504
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method of evaluating element distribution within a data set, such as pixel characteristics whose scatterness is quantified. Scatterness is evaluated for individual scale levels as the image is merged through smaller scale levels. At each level, every pixel block (i.e., 2×2) in the region of interest merges to one pixel to form the next level. Select characteristics of the pixels are assessed in the merge, and the image may be simplified to fewer pixel states so the merges require less processor overhead. In one merge mode if any pixel in the block has the desired characteristic, then the resulting merged pixel is set with that characteristic. The merging rate of the pixels is used to determine the scatterness for the pixel distribution. A scatterness sequence can be used separately or in combination with known techniques for comparing images in applications such as search and classification.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.