Open-circuit testing system and method
US7612568B2 · kind B2 · utility
2Cited by
9References
13Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | May 2, 2007 |
| Grant date | Nov 3, 2009 |
| Priority date | — |
| Expiry date | Sep 10, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/312
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The invention discloses a testing system and method suitable for determining the connection state of an electronic component in an electronic device assembly. In an embodiment, the testing system comprises a signal sensing unit configured to provide a sensed signal induced by capacitive coupling in response to the output of a testing signal passing through a tested pin, a signal processor unit configured to filter and over-sample the sensed signal to obtain a digital signal, and an analyzer unit configured to compute the digital signal for determining a connection state of the test pin.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.