Patent · US Active

Inversion of scan clock for scan cells

US7613967B1 · kind B1 · utility

13Cited by

17References

16Claims

0Family size

Assignee

Marvell International Ltd. · BM

Inventor

Teck Wee Patrick Tan · Bukit Mertajam, MY

Key dates

Filing date	Oct 29, 2008
Grant date	Nov 3, 2009
Priority date	—
Expiry date	Oct 29, 2028

Classification

Technology area (CPC G)Physics
CPC primaryG01R31/318594
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A device includes a scan circuit including a scan chain. The scan chain includes a first plurality of scan cells that receive a first scan clock signal in a first clock domain. A second plurality of scan cells receives a second scan clock signal in a second clock domain. A scan clock source generates the first scan clock signal and the second scan clock signal, and selectively inverts the first scan clock signal and the second scan clock signal based on an operating mode of the first plurality of scan cells and the second plurality of scan cells, respective flip-flop arrangements of the first clock domain and the second clock domain.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.