Patent · US Active

Method for forming a capacitor structure

US7615444B2 · kind B2 · utility

2Cited by
1References
11Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJun 29, 2006
Grant dateNov 10, 2009
Priority date
Expiry dateMar 1, 2027

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10B12/31

Abstract

A method for forming a capacitor structure, according to which the following consecutive steps are executed: providing a substrate having on its surface contact pads and a dielectric mold provided with at least one trench leaving exposed the contact pads; forming a first conductive layer on side walls of the trench in a top region of the trench the conductive layer being without contact to the contact pads; depositing a first dielectric layer; depositing a second conductive layer on the contact pad and on the side walls of the trench; depositing a second dielectric layer; depositing a third conductive layer; and forming a vertical plug interconnecting the first conductive layer and the third conductive layer.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.