Examination method for CPP-type magnetoresistance effect element having two free layers
US7615996B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 21, 2009 |
| Grant date | Nov 10, 2009 |
| Priority date | — |
| Expiry date | Jan 21, 2029 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10T428/1121
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
An examination method is structured, with respect to a magnetization direction of an orthogonalizing bias function part formed on a posterior part of an magnetoresistance (MR) effect element, of changing the magnetization direction of the orthogonalizing bias function part between a first magnetization forming mode, wherein the magnetization direction is from the anterior side of the element to the posterior side thereof, and a second magnetization forming mode, wherein the magnetization direction is from the posterior side of the element to the anterior side thereof, measuring the output waveform of the element in response to an external magnetic field for each magnetization forming mode and checking the state of the output waveforms of both modes in order to examine whether or not the magnetization directions of the first magnetic layer and the second magnetic layer, both of which functions as free layers, are antiparallel to each other in the track width direction before the orthogonalizing bias function part starts functioning. With the structure, it is realized to easily examine whether or not the magnetization directions of two free layers have surely been made antiparallel t…
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