Pulsed I-V measurement method and apparatus
US7616014B1 · kind B1 · utility
3Cited by
4References
8Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Feb 8, 2007 |
| Grant date | Nov 10, 2009 |
| Priority date | — |
| Expiry date | Sep 29, 2027 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01L2924/0002
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and apparatus for measuring a pulsed I-V characteristic of a DUT that has a signal terminal and a return terminal includes connecting a pulse unit between the signal and return terminals, the pulse unit having a pulse source and a pulsed current measuring device; pulsing the signal terminal with the pulse unit; measuring a pulsed current through the signal terminal with the current measuring device in response to the pulsing; and outputting, storing, displaying, or otherwise using the current measurement.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.