Compressive sampling and signal inference
US7616306B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 31, 2007 |
| Grant date | Nov 10, 2009 |
| Priority date | — |
| Expiry date | May 8, 2028 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N19/63
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
An optical wavemeter includes a slit, a diffraction grating, a mask, a complementary grating, and a detector. A monochromatic source is incident on the slit. The diffraction grating produces an image of the slit in an image plane at a horizontal position that is wavelength dependent. The mask has a two-dimensional pattern of transmission variations and produces different vertical intensity channels for different spectral channels. The complementary grating produces a stationary image of the slit independent of wavelength. The detector measures vertical variations in intensity of the stationary image, and the mask is created so that the number of measurements made by the detector is less than the number of spectral channels sampled.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.