Absolute position determination of an object using pattern recognition
US7617070B2 · kind B2 · utility
14Cited by
33References
20Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Nov 12, 2007 |
| Grant date | Nov 10, 2009 |
| Priority date | — |
| Expiry date | Mar 7, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V20/13
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A position determining system that includes a spherical inertial sensor assembly, at least one position determining device and a processor is provided. The spherical inertial sensor assembly has a surface with a reference pattern. Each position determining device includes a focal plane configured to record images of the reference pattern and star images. The processor is configured to determine the angular position of the spherical inertial sensor assembly via recorded images of the reference pattern and correlate the determined angular position based on the star images.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.