Multi-layered measurement model for data collection and method for data collection using same
US7617315B2 · kind B2 · utility
Inventors
Key dates
| Filing date | Aug 30, 2005 |
| Grant date | Nov 10, 2009 |
| Priority date | — |
| Expiry date | Jan 10, 2028 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04L43/0876
- WIPO fieldDigital communication
- WIPO sectorElectrical engineering
Abstract
A method and system are described for collecting information from a device in a network at a collection interval. According to an exemplary embodiment, a method for collecting the information includes determining data needed from the device at the collection interval to evaluate the information. A measurement request is defined for collecting the data from the device at the collection interval. The measurement request is merged with other measurement requests for collecting the data from the device at the collection interval into a single merged measurement request at the collection interval. The measurement request is also merged with other measurement requests for collecting the data from the device at different collection intervals having a common integral divisor into a single merged measurement request at a highest of the different collection intervals.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.