Metallic thin film piezoresistive transduction in micromechanical and nanomechanical devices and its application in self-sensing SPM probes
US7617736B2 · kind B2 · utility
10Cited by
30References
20Claims
0Family size
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Key dates
| Filing date | Jun 30, 2008 |
| Grant date | Nov 17, 2009 |
| Priority date | — |
| Expiry date | Jun 30, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01Q60/38
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Thin metallic films are used as the piezoresistive self-sensing element in microelectromechanical and nanoelectromechanical systems. The specific application to AFM probes is demonstrated.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.