Method and microscope for high spatial resolution examination of samples

US7619732B2 · kind B2 · utility

Assignee

• LEICA MICROSYSTEMS CMS GMBH · DE

Inventors

• Hilmar Gugel · Dossenheim, DE
• Marcus Dyba · Wetzlar, DE

Key dates

• Filing date: Jan 16, 2007
• Grant date: Nov 17, 2009
• Expiry date: Sep 24, 2027

Classification

• Technology area (CPC G): Physics
• CPC primary: G02B27/58
• WIPO field: Optics
• WIPO sector: Instruments

Abstract

A method and a microscope, in particular a laser scanning fluorescence microscope, for high spatial resolution examination of samples, the sample (1) to be examined comprising a substance that can be repeatedly converted from a first state (Z1, A) into a second state (Z2, B), the first and the second states (Z1, A; Z2, B) differing from one another in at least one optical property, comprising the steps that the substance in a sample region (P) to be recorded is firstly brought into the first state (Z1, A), and that the second state (Z2, B) is induced by means of an optical signal (4), spatially delimited subregions being specifically excluded within the sample region (P) to be recorded, are defined with regard to increasing resolution in any desired direction and with regard to an increased imaging rate by the fact that the optical signal (4) is simultaneously concentrated at a number of focal points, and the focal points are focused into various sites of the sample (1).