Patent · US Active

Near-field scanning optical microscope probe having a light emitting diode

US7621964B2 · kind B2 · utility

0Cited by

0References

10Claims

0Family size

Assignee

The Board of Regents of the University of Texas System · US

Inventors

Kazunori Hoshino · Tsukuba, JP
Xiaojing Zhang · Austin, US

Key dates

Filing date	Aug 31, 2007
Grant date	Nov 24, 2009
Priority date	—
Expiry date	May 30, 2028

Classification

Technology area (CPC Y)Emerging Cross-Sectional Technologies
CPC primaryY10S977/862
WIPO fieldMicro-structural and nano-technology
WIPO sectorChemistry

Abstract

An improved near-field scanning optical microscope probe is disclosed. The near-field scanning optical microscope probe includes a probe body and two electrodes extending from the probe body to form a probe tip. In addition, a light-emitting diode is disposed between the two electrodes at the probe tip to act as a light source for the near-field scanning optical microscope probe.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.