Semiconductor device having contact failure detector
US7622940B2 · kind B2 · utility
4Cited by
5References
18Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jul 24, 2008 |
| Grant date | Nov 24, 2009 |
| Priority date | — |
| Expiry date | Jul 24, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/68
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A semiconductor device having a circuit for detecting a defective connection to the semiconductor device. A semiconductor device including multiple internal circuits; multiple pads respectively connected to the internal circuits; and a contact failure detector coupled between the pads and a common node and configured to detect contact failures between tips of a probe card and the pads.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.