Patent · US Active

Digital calibration loop for an analog to digital converter

US7623050B2 · kind B2 · utility

8Cited by
18References
32Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 13, 2006
Grant dateNov 24, 2009
Priority date
Expiry dateDec 13, 2026

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH03M1/363
  • WIPO fieldBasic communication processes
  • WIPO sectorElectrical engineering

Abstract

A method and apparatus to counter effects of an offset voltage by calibrating an analog-to-digital converter (ADC). A digital calibration loop minimizes the effects of offset voltage to improve ADC accuracy as well as provide a low-power, submicron-scale ADC. A calibration circuit senses an ADC output and adjusts a variable calibration voltage to counter the effects of the offset voltage. Reduction of the offset voltage effects increases the ADC accuracy.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.