Apparatus and method for the automated marking of defects on webs of material
US7623699B2 · kind B2 · utility
12Cited by
71References
22Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Apr 19, 2004 |
| Grant date | Nov 24, 2009 |
| Priority date | — |
| Expiry date | Apr 13, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2021/8927
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system for the characterization of webs that permits the identification of anomalous regions on the web to be performed at a first time and place, and permits the localization and marking of actual defects to be performed at a second time and place.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.