Method of testing an electronic circuit and apparatus thereof
US7623982B2 · kind B2 · utility
1Cited by
5References
25Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Nov 5, 2007 |
| Grant date | Nov 24, 2009 |
| Priority date | — |
| Expiry date | Dec 20, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/311
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of testing an electronic circuit is provided. The method comprises radiating a laser beam onto the electronic circuit, and determining a plurality of samples of a response signal output by the electronic circuit during the period when the laser beam is radiated. The method further comprises accumulating the plurality of samples to generate a value, and generating a test result based on the value.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.