Patent · US Active

X-ray detector with correction for scattered radiation

US7626174B2 · kind B2 · utility

1Cited by

9References

20Claims

0Family size

Assignee

KONINKLIJKE PHILIPS ELECTRONICS NV · NL

Inventors

Bernd Schweizer · Herzogenrath, DE
Gereon Vogtmeier · Aachen, DE
Klaus Engel · Veldhoven, NL

Key dates

Filing date	Jun 24, 2005
Grant date	Dec 1, 2009
Priority date	—
Expiry date	Jul 31, 2026

Classification

Technology area (CPC G)Physics
CPC primaryG01T1/1648
WIPO fieldEnvironmental technology
WIPO sectorChemistry

Abstract

The invention refers to X-ray devices, an X-ray detector and a method of correcting intensity signals. An X-ray detector then comprises for determining the intensity of X-rays, which comprise a proportion of primary radiation having an irradiation direction and a proportion of scattered radiation, at least a first sensor elements, which are each provided for converting the X-rays into first and second intensity signals, and a filter element, which is provided for decreasing the proportion of scattered radiation in the intensity of the X-rays, wherein the second sensor elements are arranged in irradiation direction behind the filter element and wherein the first sensor element fastened to the filter element is provided for determining the intensity of the X-rays before leaving the filter element. The proportion of the scattered radiation calculated from the measuring data of the first and second sensor elements is provided for correcting the second intensity signals for the following image generation.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.