Method and apparatus for producing an electrical property image of substantially homogeneous objects containing inhomogeneities
US7627362B2 · kind B2 · utility
9Cited by
12References
9Claims
0Family size
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Key dates
| Filing date | Nov 4, 2003 |
| Grant date | Dec 1, 2009 |
| Priority date | — |
| Expiry date | Sep 30, 2026 |
Classification
- Technology area (CPC A)Human Necessities
- CPC primaryA61B5/7257
- WIPO fieldMedical technology
- WIPO sectorInstruments
Abstract
An electrical parameter imaging apparatus and method includes the acquisition of a charge distribution pattern on an array of electrodes that surround an object being imaged. In addition the exterior boundary, or contours of the object is measured by an array of light beams and associated light sensors. The contour measurement is employed to provide a first estimate of the object geometry needed to compute an electrical parameter image from the acquired charge distribution pattern.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.