Method and apparatus for calibrating an X-ray diagnostic system
US7628538B2 · kind B2 · utility
10Cited by
0References
4Claims
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Assignee
Inventor
Key dates
| Filing date | May 2, 2008 |
| Grant date | Dec 8, 2009 |
| Priority date | — |
| Expiry date | May 2, 2028 |
Classification
- Technology area (CPC A)Human Necessities
- CPC primaryA61B2090/3983
- WIPO fieldMedical technology
- WIPO sectorInstruments
Abstract
The subject matter of the present application relates to methods for calibrating an X-ray diagnostic system and apparatus for use in the calibration methods. In one embodiment, the apparatus includes a position detection system having an acquisition unit. An X-ray phantom is disposed near the acquisition unit in a known position and/or orientation relative to a coordinate system of the position detection system. The X-ray phantom may be detachably mounted on the acquisition unit.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.