Test element with a one layer reaction film
US7629175B2 · kind B2 · utility
2Cited by
10References
31Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Feb 18, 2005 |
| Grant date | Dec 8, 2009 |
| Priority date | — |
| Expiry date | Feb 5, 2027 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10T436/144444
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The invention concerns test elements and methods for the optical detection of an analyte in a sample. The test element includes a support having at least one transparent portion, and a one-layer film positioned on the support. The film has a thickness when dry of less than about 10 μm. The method includes contacting the sample with the test element and determining the analyte concentration in the sample.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.