Test carrier
US7629788B2 · kind B2 · utility
0Cited by
6References
11Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Sep 4, 2008 |
| Grant date | Dec 8, 2009 |
| Priority date | — |
| Expiry date | Sep 4, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R1/04
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A test carrier includes an insert body, a first latch assembly including one or more first latches pivotally attached to the insert body, and a second latch assembly including one or more second latches pivotally attached to the insert body. The second latch assembly is configured to engage with an external connection terminal array of an electronic component during testing thereof. A method of testing a semiconductor device and a system for testing a semiconductor device are also provided.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.