Contact type single side probe device and apparatus and method for testing open or short circuits of conductive lines using the same
US7629796B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 12, 2007 |
| Grant date | Dec 8, 2009 |
| Priority date | — |
| Expiry date | Feb 13, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R1/06788
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Disclosed herein are an apparatus and method for testing open and short circuits of conductive lines. A probe is brought into contact with one end of each of the conductive lines, AC power is applied, and the conductive lines are tested using electrical variations measured in the probe. By using a single-side probe device, it is possible to remarkably reduce the number of probes when the open or short circuit of a PCB pattern, a data transmission line or an electrical cable is tested and to remarkably reduce time or labor necessary for testing the open or short circuit. Since the measurement is performed only at one end of the conductive line to test the open or short circuit of the conductive line, it is possible to self-diagnose the open or short circuit when a single-side probe device is mounted in an input/output port of an electrical device.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.