Probe card assembly and test probes therein
US7629803B1 · kind B1 · utility
2Cited by
8References
19Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Aug 28, 2008 |
| Grant date | Dec 8, 2009 |
| Priority date | — |
| Expiry date | Aug 28, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R1/06772
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Disclosed are a probe card assembly and test probes used therein. The probe card assembly includes a main body, a probe base provided at a center of the main body, and a plurality of test probes connecting the main body and the probe base. Therein, each of the test probes has a tip extending out from the probe base for contacting and testing a wafer. The test probes include at least one power probe, at least one grounding probe and a plurality of signal probes, wherein each of the test probes has a middle section between the main body and contains therein a core that is wrapped by an insulation layer.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.