Dedicated process diagnostic device
US7630861B2 · kind B2 · utility
11Cited by
324References
32Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | May 25, 2006 |
| Grant date | Dec 8, 2009 |
| Priority date | — |
| Expiry date | May 25, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG05B2219/24033
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A field mountable dedicated process diagnostic device is used for diagnosing operation of an industrial control or monitoring system. An input is configured to receive at least one process signal related to operation of the industrial process. A memory contains diagnostic program instructions configured to implement a diagnostic algorithm using the process signal. The diagnostic algorithm is specific to the industrial process. A microprocessor performs the diagnostic program instructions and responsively diagnoses operation of the process based upon the process signal.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.