High resolution elastography using two step strain estimation
US7632230B2 · kind B2 · utility
3Cited by
5References
26Claims
0Family size
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Key dates
| Filing date | Mar 20, 2006 |
| Grant date | Dec 15, 2009 |
| Priority date | — |
| Expiry date | Aug 15, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30004
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
High-resolution elastography employs a multiple-step process in which successively finer samplings of data and smaller areas of data are evaluated to provide increasingly accurate displacement measurements, wherein each displacement measurement guides the determination of corresponding regions of comparison used in the next displacement evaluation.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.