Mass spectrometry system having ion deflector
US7633059B2 · kind B2 · utility
5Cited by
14References
18Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Oct 13, 2006 |
| Grant date | Dec 15, 2009 |
| Priority date | — |
| Expiry date | Aug 10, 2027 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J49/004
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
A tandem mass spectrometer and method for calibrating a tandem mass spectrometer. The tandem mass spectrometer comprises first and second mass analyzers. The first and second mass analyzers form an ion path. The second mass analyzer is positioned downstream from the first mass analyzer and is arranged to receive ions from the first mass analyzer. An electrode arrangement positioned between the first and second mass analyzers. The electrode assembly is configured to selectively deflect ions from the ion path.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.