Through hole formation state detecting device and electronic timepiece using the detecting device
US7633075B2 · kind B2 · utility
1Cited by
1References
8Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Sep 24, 2008 |
| Grant date | Dec 15, 2009 |
| Priority date | — |
| Expiry date | Sep 24, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG04C3/146
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
When a light emission element emits no light, a detected signal from a photodetection element is captured as an intensity of external light. Then, a threshold value is offset by the intensity of the external light. The offset threshold is then compared to a detected signal from the photodetection element when the light emission element emits light, thereby determining the presence of a through hole between the light emission element and the photodetection element through which hole light passes without being influenced by external light.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.