Patent · US Active

Device for testing electronic components, in particular ICs, having a sealing board arranged inside a pressure test chamber

US7633304B2 · kind B2 · utility

2Cited by

6References

4Claims

0Family size

Assignee

Multitest Elektronische Systeme GmbH · DE

Inventors

Max Schaule · Mindelheim, DE
Andreas Nagy · Munich, DE
Stefan Kurz · Frankfurt, DE

Key dates

Filing date	Jul 9, 2008
Grant date	Dec 15, 2009
Priority date	—
Expiry date	Jul 9, 2028

Classification

Technology area (CPC G)Physics
CPC primaryG01R31/2862
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A device for testing electronic components such as integrated circuit ICs, under particular pressure conditions, has a pressure test chamber with contact elements which on the one hand are connected to an electronic testing device and on the other hand extend into a cavity of the pressure test chamber. Arranged inside the cavity of the pressure test chamber, there is and air-fight sealing board which extends transversely over the contact elements and is sealed peripherally from an assigned pressure chamber half. By means of the sealing board, first contact element sections are separated air-tightly from second contact element sections but are in electrically conductive connection.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.