Method for permanent calibration based on actual measurement
US7634374B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 26, 2005 |
| Grant date | Dec 15, 2009 |
| Priority date | — |
| Expiry date | Dec 1, 2025 |
Classification
- Technology area (CPC A)Human Necessities
- CPC primaryA61B2090/3983
- WIPO fieldMedical technology
- WIPO sectorInstruments
Abstract
There is described a method of manufacturing a device to be used with a computer-aided surgery system, a method of calibrating the device, and the device itself. After fabrication, the device is measured to obtain true parameters thereof. The true parameters are stored on a storage medium associated with the device and include measurement data of high precision relating to dimensions of the device as well as to relative positioning of a tracker on the device with respect to the device. The true parameters are entered into the system and when the tracker is located in the 3D environment, the device can then be located in the 3D environment with a high degree of precision using the true parameters.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.