Diagnostic device for use in process control system
US7634382B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 26, 2007 |
| Grant date | Dec 15, 2009 |
| Priority date | — |
| Expiry date | Aug 8, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG05B23/024
- WIPO fieldControl
- WIPO sectorInstruments
Abstract
A method and diagnostic device are disclosed which can receive process variable values (x(t)) of a process variable of a process medium of a process, and extract and record measurement statistics data from such process variable values, which are measured during a measuring phase. Training statistics data can be extracted and recorded from such process variable values, which are measured during a training phase. The measurement statistics data can be compared with training statistics data recorded before the measurement statistics data. The training statistics data can include a training empirical statistical distribution, which can be a distribution of a function of process variable values, which are measured during a training phase, or a distribution of a function of coefficients Xt(k), which are coefficients of a function of a transform of process variable values (x(t)), which are measured during a training phase.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.