Trace delay error compensation
US7634747B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 17, 2007 |
| Grant date | Dec 15, 2009 |
| Priority date | — |
| Expiry date | Oct 25, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/3016
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of trace delay error compensation for measurements that are taken remotely from the signal source or receiver of a circuit uses data available from a computer aided design (CAD) tool to characterize electrical connections to an instrument measurement point, such as a connectorless probe, which is remote from the signal source or receiver. Extracted parameters from the CAD data are applied to signals acquired by the probe to adjust the signal timing and/or shape to more accurately represent the signal information timing at the signal source or receiver or other remote location of interest to a user. The corrected signals at the desired location may be displayed by a measurement instrument.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.