Method and apparatus for pattern-based system design analysis using a meta model
US7634766B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 20, 2005 |
| Grant date | Dec 15, 2009 |
| Priority date | — |
| Expiry date | Oct 24, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F8/74
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method for analyzing a target system that includes obtaining a characteristics model, loading the characteristics model into a meta model, obtaining a plurality of characteristics from the target system using a characteristics extractor, wherein each of the plurality of characteristics is associated with the characteristics model, storing each of the plurality of characteristics obtained from the target system in a characteristics store, and analyzing the target system by issuing at least one query to the characteristics store to obtain an analysis result, wherein the issuing the at least one query comprises verifying the at least one query using the meta model.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.