Heater chip test circuit and methods for using the same
US7635174B2 · kind B2 · utility
9Cited by
20References
18Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Aug 22, 2005 |
| Grant date | Dec 22, 2009 |
| Priority date | — |
| Expiry date | Sep 20, 2026 |
Classification
- Technology area (CPC B)Performing Operations; Transporting
- CPC primaryB41J2/0458
- WIPO fieldTextile and paper machines
- WIPO sectorMechanical engineering
Abstract
Test circuits on heater chips for testing a heater circuit having a heater element and a first power device. The test circuit can include a second power device, a test device configured to hold the first power device off and the second power device on for a selected heater circuit when the test device receives a signal to activate the test circuit, and a common test output to transmit a signal indicative of a state of the selected heater circuit. Methods for using the same are also provided.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.