Method for comparing customer and test load data with comparative functional coverage hole analysis
US7636871B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 24, 2008 |
| Grant date | Dec 22, 2009 |
| Priority date | — |
| Expiry date | Oct 24, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/3676
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
One aspect of the present invention includes performance of a comparative functional coverage technique for comparing analysis of actual operational load data, such as customer data, with test operational load data. In one embodiment, coverage and holes analysis operations are performed on each of actual trace data produced by the operation of actual activities, and test trace data produced by the operation of a simulation within a test execution. The functional coverage and hole analysis results produced for each of the actual data source and the test data source are then compared to discover the most important functional holes relevant to testing, namely holes which appear only in the test but not within the actual operation. The results of the holes comparison detailing which holes exist within the test are then presented and ultimately utilized to improve the test.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.