Patent · US Active

Probe tip plating

US7638028B2 · kind B2 · utility

16Cited by

6References

16Claims

0Family size

Assignee

SV Probe Pte. Ltd. · SG

Inventors

Bahadir Tunaboylu · Chandler, US
Edward L. Malantonio · Conshohocken, US
David T. Beatson · Kennett Square, US
Andrew Hmiel · Glenside, US

Key dates

Filing date	Aug 3, 2005
Grant date	Dec 29, 2009
Priority date	—
Expiry date	Jul 6, 2027

Classification

Technology area (CPC G)Physics
CPC primaryG01R3/00
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A method of processing a probe element includes (a) providing a probe element comprising a first conductive material, and (b) coating only a tip portion of the probe element with a second conductive material.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.