Patent · US Active

Electronic device test set and contact used therein

US7639026B2 · kind B2 · utility

19Cited by

5References

3Claims

0Family size

Assignee

Johnstech International Corporation · US

Inventors

Dennis B. Shell · Webster, US
Mathew L. Gilk · Lakeville, US
Jose Lopez · Bellesserre, FR

Key dates

Filing date	Feb 22, 2007
Grant date	Dec 29, 2009
Priority date	—
Expiry date	Feb 22, 2027

Classification

Technology area (CPC G)Physics
CPC primaryG01R1/0466
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A contact for use in a test set which can be mounted to a load board of a tester apparatus. The contact, which serves to electrically connect at least one lead of a device being tested with a corresponding metallic trace on the load board, has a first end defining multiple contact points. As the contact is rotated about an axis generally perpendicular to a plane defined by the contact, successive contact points are sequentially engaged by a lead of the device being tested.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.