Abnormality diagnosing system for mechanical equipment
US7640139B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 17, 2005 |
| Grant date | Dec 29, 2009 |
| Priority date | — |
| Expiry date | Jun 7, 2026 |
Classification
- Technology area (CPC F)Mechanical Engineering; Lighting; Heating
- CPC primaryF16C2233/00
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Provided are an envelope processor 103, for obtaining an envelope for a detected signal; a FFT unit 104, for converting the envelope into a frequency spectrum; a peak detector 105, for smoothing the frequency spectrum by calculating a moving average, for further performing smoothing and differentiation for the spectrum, and detecting, as peaks, frequency points at which a sign of a differential coefficient is changed from positive to negative, for extracting peaks having a predetermined threshold value or greater, and for sorting the extracted peaks and detecting upper peaks; and a diagnosis processor T, for diagnosing an abnormality based on the detected peaks.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.