Method and apparatus for an embedded time domain reflectometry test
US7640468B2 · kind B2 · utility
13Cited by
7References
23Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Nov 23, 2004 |
| Grant date | Dec 29, 2009 |
| Priority date | — |
| Expiry date | Oct 28, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/318572
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and apparatus for testing an integrated circuit interconnect comprises an IC having circuitry embedded in the IC capable of providing a pseudo time domain reflectometry test by launching a test transition onto the interconnect and capturing a reflection of the test transition.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.