Meta-data driven test-data generation with controllable combinatorial coverage
US7640470B2 · kind B2 · utility
22Cited by
11References
20Claims
0Family size
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Key dates
| Filing date | Aug 21, 2006 |
| Grant date | Dec 29, 2009 |
| Priority date | — |
| Expiry date | Jun 21, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/3676
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Generation of test data for systems having functionality subject to a grammar or other sort of meta-data is automated by a controlled combinatorial approximation of naïve combinatorial coverage. A suite of control mechanisms are applied to an algorithm that generates test data to provide well-defined and understandable approximations of full combinatorial coverage.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.