Instruction profiling using multiple metrics
US7640539B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 12, 2005 |
| Grant date | Dec 29, 2009 |
| Priority date | — |
| Expiry date | Aug 9, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/3616
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A system and method for collecting a plurality of metrics during a single run of a computer program. The mechanism of the present invention initializes a plurality of counters to count events associated with metrics of interest. The mechanism of the present invention then counts the occurrence of events associated with metrics of interest during a single execution of a computer program. Responsive to a determination that a counter in a plurality of counters has generated an interrupt, the interrupt is rerouted to an interrupt handler, wherein the interrupt handler generates trace records comprising trace information corresponding to the interrupt. The mechanism of the present invention then generates profiles for the trace records, wherein the profiles differentiate the trace records based on the metric type associated with each trace record.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.