Thermal switch calibration apparatus and methods
US7641383B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 27, 2007 |
| Grant date | Jan 5, 2010 |
| Priority date | — |
| Expiry date | Jan 25, 2028 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01H69/01
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
An apparatus and method for testing thermal switches is disclosed including modulating the temperature of a receiver in thermal contact with a thermal switch at a first rate within a range containing the nominal switch temperature of the thermal switch. A first temperature at which the switch changes state is recorded. The temperature is then modulated at a second rate and a second temperature at which the switch again changes state is recorded. The temperature may be modulated at a third rate slower than the second rate to determine a third temperature. The first, second, and third switch temperatures are then processed and output to an operator. The first, second, and third rates may be determined according to an exponentially decreasing function.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.