Probe card for tests on photosensitive chips and corresponding illumination device
US7642792B2 · kind B2 · utility
5Cited by
4References
17Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Dec 1, 2006 |
| Grant date | Jan 5, 2010 |
| Priority date | — |
| Expiry date | Aug 21, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/311
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A probe card and its corresponding illumination device are provided for performing electrical operating tests, preferably done in parallel, with respect to a plurality of chips provided with connection pads, under illumination conditions given by a lighting source, the probe card being a printed circuit board (PCB) including electrical connections to the chip on its lower face, the probe card also including electrical connections to the lighting.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.