Method and apparatus of build-in self-diagnosis and repair in a memory with syndrome identification
US7644323B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 30, 2007 |
| Grant date | Jan 5, 2010 |
| Priority date | — |
| Expiry date | Mar 18, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C29/72
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Disclosed is a build-in self-diagnosis and repair method and apparatus in a memory with syndrome identification. It applies a fail-pattern identification and a syndrome-format structure to identify at least one type of faulty syndrome in the memory during a memory testing, then generates and exports fault syndrome information associated with the corresponding faulty syndrome. According to the fault syndrome information, the method applies a redundancy analysis algorithm, allocates spare memory elements and repairs the faulty cells in the memory. The syndrome-format structure respectively applies single-faulty-word-syndrome format, faulty-row-segment-syndrome format, and faulty-column-segment-syndrome format for different faulty syndromes, such as faulty row segments and single faulty words, faulty column segments and single faulty words, all of single faulty words, faulty row segments and faulty column segments, and so on.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.